TY  - JOUR
ID  - cherenack_bending_edl
T1  - Impact of Mechanical Bending on ZnO and IGZO Thin-Film Transistors
A1  - Cherenack, Kunigunde
A1  - Münzenrieder, Niko
A1  - Tröster, Gerhard
JA  - Electron Device Letters, IEEE
Y1  - 2010
VL  - 31
SP  - 1254
EP  - 1256
ER  -